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Acoustics

Email Verified Advanced Research Center for Nanolithography (ARCNL)

Phd – student: Ultrafast photoacoustics for semiconductor metrology

  • Project cost Funding amount:  Check Description

Work ActivitiesBackgroundIn semiconductor device manufacturing, optical metrology tools are used determine the position of a Si wafer by measuring light, scattered from so-called alignment markers. When these markers become covered…

Published 168 Days ago
Closing in 196 Days

  • PhD Research Project

  • Position Funding Type Research Assistantship (RA)
  • Attendance Type On Campus (Full Time)
  • Application deadline Deadline: February 19, 2026
  • University/Institute Name Advanced Research Center for Nanolithography (ARCNL)
  • //applyindex.com/wp-content/uploads/2021/11/netherlands.png Netherlands
  • Position Funding TypeSave
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